Fischerscope XDLM 237 XRAY / X-ray fluorescence spectrometer XRAY spectrometer for non-destructive determination of layer thicknesses for all common metal coatings as well as other material analyses using X-ray fluorescence. Contact us if you have any questions about the previous application. The device is fully functional and will be reset to factory settings before delivery. All maintenance was carried out by the manufacturer's service team according to the manufacturer's specifications. Any repairs and acceptances were also commissioned from the manufacturer. It is a full protection device with the appropriate type approval. Periodic inspections in accordance with the requirements of the Radiation Protection Ordinance have always been carried out by approved experts.
